مؤتمر
A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip
| العنوان: | A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip |
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| المؤلفون: | Manzini, A., Inglese, P., Caldi, L., Cantoro, R., Carnevale, G., Coppetta, M., Giltrelli, M., Mautone, N., Irrera, F., Ullmann, R., Bernardi, P. |
| المصدر: | 2019 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2019 IEEE European. :1-6 May, 2019 |
| Relation: | 2019 IEEE European Test Symposium (ETS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781728111735 9781728111728 |
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| تدمد: | 15581780 |
| DOI: | 10.1109/ETS.2019.8791529 |