Optimization of a BEOL Aluminum Deposition Process Enabling Wafer Level Al-Al Thermo-Compression Bonding

التفاصيل البيبلوغرافية
العنوان: Optimization of a BEOL Aluminum Deposition Process Enabling Wafer Level Al-Al Thermo-Compression Bonding
المؤلفون: Schulze, Sebastian, Wietstruck, Matthias, Fraschke, Mirko, Kerepesi, Peter, Kurz, Helmut, Rebhan, Bernhard, Kaynak, Mehmet
المصدر: 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) Electronic Components and Technology Conference (ECTC), 2019 IEEE 69th. :218-224 May, 2019
Relation: 2019 IEEE 69th Electronic Components and Technology Conference (ECTC)
قاعدة البيانات: IEEE Xplore Digital Library