دورية أكاديمية
Measurement and Analysis of System-Level ESD-Induced Jitter in a Delay-Locked Loop
| العنوان: | Measurement and Analysis of System-Level ESD-Induced Jitter in a Delay-Locked Loop |
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| المؤلفون: | Jeong, M., Shin, M., Kim, J., Seung, M., Lee, S. |
| المصدر: | IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 62(5):1840-1851 Oct, 2020 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189375 1558187X |
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| DOI: | 10.1109/TEMC.2019.2936826 |