دورية أكاديمية
Measurement and Analysis of System-Level ESD-Induced Jitter in a Delay-Locked Loop
العنوان: | Measurement and Analysis of System-Level ESD-Induced Jitter in a Delay-Locked Loop |
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المؤلفون: | Jeong, M., Shin, M., Kim, J., Seung, M., Lee, S. |
المصدر: | IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 62(5):1840-1851 Oct, 2020 |
قاعدة البيانات: | IEEE Xplore Digital Library |
تدمد: | 00189375 1558187X |
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DOI: | 10.1109/TEMC.2019.2936826 |