Characterization of On-die Interconnects Exhibiting Slow-Wave Propagation

التفاصيل البيبلوغرافية
العنوان: Characterization of On-die Interconnects Exhibiting Slow-Wave Propagation
المؤلفون: Romo L., Gerardo, Sanchez, Adan, Sonawane, Vinit, Powers, Scott, Michalka, Tim, Nae, Bogdan, Shadrokh, Yasaman, Johansson, Jimmy, Robinson, Peter
المصدر: 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI), 2019 IEEE International Symposium on. :532-536 Jul, 2019
Relation: 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781538691991
9781538691984
DOI:10.1109/ISEMC.2019.8825232