التفاصيل البيبلوغرافية
| العنوان: |
Optimal edge termination for high oxide reliability aiming 10kV SiC n-IGBTs |
| المؤلفون: |
Perkins, S., Antoniou, M., Tiwari, Amit K., Arvanitopoulos, A., Gyftakis, K. N., Trajkovic, T., Udrea, F., Lophitis, N. |
| المصدر: |
2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED) Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED), 2019 IEEE 12th International Symposium on. :358-363 Aug, 2019 |
| Relation: |
2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
