دورية أكاديمية
Modeling Interface Charge Traps in Junctionless FETs, Including Temperature Effects
| العنوان: | Modeling Interface Charge Traps in Junctionless FETs, Including Temperature Effects |
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| المؤلفون: | Rassekh, A., Jazaeri, F., Fathipour, M., Sallese, J. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(11):4653-4659 Nov, 2019 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2019.2944193 |