مؤتمر
An RTL ATPG Flow Using the Gate Inherent Fault (GIF) Model Applied on Non-, Standard- and Random-Access-Scan (RAS)
| العنوان: | An RTL ATPG Flow Using the Gate Inherent Fault (GIF) Model Applied on Non-, Standard- and Random-Access-Scan (RAS) |
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| المؤلفون: | Strauch, Tobias |
| المصدر: | 2019 22nd Euromicro Conference on Digital System Design (DSD) Digital System Design (DSD), 2019 22nd Euromicro Conference on. :51-60 Aug, 2019 |
| Relation: | 2019 22nd Euromicro Conference on Digital System Design (DSD) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9781728128627 |
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| DOI: | 10.1109/DSD.2019.00018 |