التفاصيل البيبلوغرافية
| العنوان: |
Testing of In-Memory-Computing 8T SRAMs |
| المؤلفون: |
Tsai, Tsai-Ling, Li, Jin-Fu, Hsu, Chun-Lung, Sun, Chi-Tien |
| المصدر: |
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2019 IEEE International Symposium on. :1-4 Oct, 2019 |
| Relation: |
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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