مؤتمر
Nanoscopic evaluation of semiconductor properties by scanning probe microscopies
| العنوان: | Nanoscopic evaluation of semiconductor properties by scanning probe microscopies |
|---|---|
| المؤلفون: | Balk, L.J., Heiderhoff, R., Koschinki, P., Maywald, M. |
| المصدر: | Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on. :1767-1774 1996 |
| Relation: | Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780333691 9780780333697 |
|---|---|
| DOI: | 10.1109/ESREF.1996.888212 |