التفاصيل البيبلوغرافية
العنوان: |
A Leveled Evaluation Method Using BCI Probe |
المؤلفون: |
Maeda, Noboru, Jomoto, Makoto |
المصدر: |
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC) Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), 2019 Joint International Symposium on. :616-619 Jun, 2019 |
Relation: |
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC) |
قاعدة البيانات: |
IEEE Xplore Digital Library |