A Leveled Evaluation Method Using BCI Probe

التفاصيل البيبلوغرافية
العنوان: A Leveled Evaluation Method Using BCI Probe
المؤلفون: Maeda, Noboru, Jomoto, Makoto
المصدر: 2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC) Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), 2019 Joint International Symposium on. :616-619 Jun, 2019
Relation: 2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9784885523229
DOI:10.23919/EMCTokyo.2019.8893757