مؤتمر
A No-Trim, Scaling-Friendly Thermal Sensor in 16nm FinFET Using Bulk Diodes as Sensing Elements
العنوان: | A No-Trim, Scaling-Friendly Thermal Sensor in 16nm FinFET Using Bulk Diodes as Sensing Elements |
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المؤلفون: | Eberlein, M., Pretl, H. |
المصدر: | ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC) Solid State Circuits Conference (ESSCIRC), ESSCIRC 2019 - IEEE 45th European. :63-66 Sep, 2019 |
Relation: | ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781728115504 9781728115498 |
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تدمد: | 26431319 |
DOI: | 10.1109/ESSCIRC.2019.8902928 |