A No-Trim, Scaling-Friendly Thermal Sensor in 16nm FinFET Using Bulk Diodes as Sensing Elements

التفاصيل البيبلوغرافية
العنوان: A No-Trim, Scaling-Friendly Thermal Sensor in 16nm FinFET Using Bulk Diodes as Sensing Elements
المؤلفون: Eberlein, M., Pretl, H.
المصدر: ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC) Solid State Circuits Conference (ESSCIRC), ESSCIRC 2019 - IEEE 45th European. :63-66 Sep, 2019
Relation: ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781728115504
9781728115498
تدمد:26431319
DOI:10.1109/ESSCIRC.2019.8902928