التفاصيل البيبلوغرافية
| العنوان: |
Study on ASIC Single Event Soft Error Evaluation Methodology and Simulaion Analysis |
| المؤلفون: |
Lei, Luo, Yinghui, Liu, Yi, Sun, Xiaoliang, Li, Qingkui, Yu |
| المصدر: |
2018 International Conference on Radiation Effects of Electronic Devices (ICREED) Radiation Effects of Electronic Devices (ICREED), 2018 International Conference on. :1-4 May, 2018 |
| Relation: |
2018 International Conference on Radiation Effects of Electronic Devices (ICREED) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
