مؤتمر
Novel Micro Scanning with Integrated Atomic Force Microscope and Confocal Laser Scanning Microscope
العنوان: | Novel Micro Scanning with Integrated Atomic Force Microscope and Confocal Laser Scanning Microscope |
---|---|
المؤلفون: | Chou, Meng-Hao, Huang, Ching-Chi, Liu, Yi-Lin, Chen, Huang-Chih, Fu, Li-Chen |
المصدر: | 2019 IEEE Conference on Control Technology and Applications (CCTA) Control Technology and Applications (CCTA), 2019 IEEE Conference on. :870-875 Aug, 2019 |
Relation: | 2019 IEEE Conference on Control Technology and Applications (CCTA) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781728127675 9781728127668 |
---|---|
DOI: | 10.1109/CCTA.2019.8920500 |