Novel Micro Scanning with Integrated Atomic Force Microscope and Confocal Laser Scanning Microscope

التفاصيل البيبلوغرافية
العنوان: Novel Micro Scanning with Integrated Atomic Force Microscope and Confocal Laser Scanning Microscope
المؤلفون: Chou, Meng-Hao, Huang, Ching-Chi, Liu, Yi-Lin, Chen, Huang-Chih, Fu, Li-Chen
المصدر: 2019 IEEE Conference on Control Technology and Applications (CCTA) Control Technology and Applications (CCTA), 2019 IEEE Conference on. :870-875 Aug, 2019
Relation: 2019 IEEE Conference on Control Technology and Applications (CCTA)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781728127675
9781728127668
DOI:10.1109/CCTA.2019.8920500