مؤتمر
Direct observation of gate oxide destruction due to BOX breakdown in SOI
| العنوان: | Direct observation of gate oxide destruction due to BOX breakdown in SOI |
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| المؤلفون: | Minami, Y., Kawanaka, S., Inoh, K., Katsumata, Y., Samata, S., Yoshimi, M., Ishiuchi, H. |
| المصدر: | 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) SOI conference SOI Conference, 2000 IEEE International. :130-131 2000 |
| Relation: | 2000 IEEE International SOI Conference. Proceedings |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 0780363892 9780780363892 |
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| تدمد: | 1078621X |
| DOI: | 10.1109/SOI.2000.892804 |