دورية أكاديمية
Surface-Electrode Ion Trap With Ground Structures for Minimizing the Dielectric Loss in the Si Substrate
| العنوان: | Surface-Electrode Ion Trap With Ground Structures for Minimizing the Dielectric Loss in the Si Substrate |
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| المؤلفون: | Tao, J., Li, H.Y., Lim, Y.D., Zhao, P., Alit Apriyana, A.A., Guidoni, L., Tan, C.S. |
| المصدر: | IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 10(4):679-685 Apr, 2020 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 21563950 21563985 |
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| DOI: | 10.1109/TCPMT.2019.2958661 |