دورية أكاديمية
Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment
| العنوان: | Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment |
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| المؤلفون: | Yan, A., Hu, Y., Cui, J., Chen, Z., Huang, Z., Ni, T., Girard, P., Wen, X. |
| المصدر: | IEEE Transactions on Computers IEEE Trans. Comput. Computers, IEEE Transactions on. 69(6):789-799 Jun, 2020 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189340 15579956 23263814 |
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| DOI: | 10.1109/TC.2020.2966200 |