مؤتمر
Designing built-in self-test circuits for embedded memories test
| العنوان: | Designing built-in self-test circuits for embedded memories test |
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| المؤلفون: | Sanghun Park, Kijong Lee, Changbum Im, Nami Kwak, Kihyun Kim, Youngdoo Choi |
| المصدر: | Proceedings of Second IEEE Asia Pacific Conference on ASICs. AP-ASIC 2000 (Cat. No.00EX434) ASICs ASICs, 2000. AP-ASIC 2000. Proceedings of the Second IEEE Asia Pacific Conference on. :315-318 2000 |
| Relation: | Proceedings of Second IEEE Asia Pacific Conference on ASICs AP-ASIC 2000 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780364708 9780780364707 |
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| DOI: | 10.1109/APASIC.2000.896971 |