التفاصيل البيبلوغرافية
| العنوان: |
Study of Front-Side Approach to Retrieve Stored Data in Non-Volatile Memory Devices Using Scanning Capacitance Microscopy |
| المؤلفون: |
Tay, J.Y., Cheah, J., Liu, Q., Gan, C.L |
| المصدر: |
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2019 IEEE 26th International Symposium on. :1-4 Jul, 2019 |
| Relation: |
2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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