التفاصيل البيبلوغرافية
| العنوان: |
Leakage Current Degradation in SiC Junction Barrier Schottky Diodes under Heavy Ion Microbeam |
| المؤلفون: |
Shuang, Cao, Qingkui, Yu, Guanghua, Du, Jinlong, Guo, He, Wang, Hongwei, Zhang, Yi, Sun |
| المصدر: |
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2019 IEEE 26th International Symposium on. :1-4 Jul, 2019 |
| Relation: |
2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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