مؤتمر
Circuit Reliability of Low-Power RRAM-Based Logic-in-Memory Architectures
| العنوان: | Circuit Reliability of Low-Power RRAM-Based Logic-in-Memory Architectures |
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| المؤلفون: | Zanotti, Tommaso, Puglisi, Francesco Maria, Pavan, Paolo |
| المصدر: | 2019 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2019 IEEE International. :1-5 Oct, 2019 |
| Relation: | 2019 IEEE International Integrated Reliability Workshop (IIRW) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781728122014 9781728122038 |
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| تدمد: | 23748036 |
| DOI: | 10.1109/IIRW47491.2019.8989875 |