مؤتمر
Reliability Engineering Enabling Continued Logic for Memory Device Scaling
| العنوان: | Reliability Engineering Enabling Continued Logic for Memory Device Scaling |
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| المؤلفون: | O'Sullivan, B. J., Ritzenthaler, R., Litta, E. Dentoni, Simoen, E., Machkaoutsan, V., Fazan, P., Ji, Y. H., Kim, C., Spessot, A., Linten, D., Horiguchi, N. |
| المصدر: | 2019 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2019 IEEE International. :1-11 Oct, 2019 |
| Relation: | 2019 IEEE International Integrated Reliability Workshop (IIRW) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781728122014 9781728122038 |
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| تدمد: | 23748036 |
| DOI: | 10.1109/IIRW47491.2019.8989891 |