Study of the High-tech Process Mechanical Integrity and Electrical Safety

التفاصيل البيبلوغرافية
العنوان:	Study of the High-tech Process Mechanical Integrity and Electrical Safety
المؤلفون:	Chang, Kuo-Chi, Chu, Kai-Chun, Chen, Tsou-Li, Lee, Yueh-Lung Ward, Lin, Yuh-Chung, Nguyen, Trong-The
المصدر:	2019 14th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2019 14th International. :162-165 Oct, 2019
Relation:	2019 14th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)
قاعدة البيانات:	IEEE Xplore Digital Library