مؤتمر
Development of an Approach to Automatic Test Generation Based on the Graph Model of a Cache Hierarchy
العنوان: | Development of an Approach to Automatic Test Generation Based on the Graph Model of a Cache Hierarchy |
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المؤلفون: | Garashchenko, Anton V., Gagarina, Larisa G., Ye, Kyaw Zaw, Dorogova, Ekaterina, Kochneva, Maria |
المصدر: | 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) Russian Young Researchers in Electrical and Electronic Engineering (EIConRus), 2020 IEEE Conference of. :1940-1944 Jan, 2020 |
Relation: | 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781728157603 9781728157610 |
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تدمد: | 23766565 |
DOI: | 10.1109/EIConRus49466.2020.9039334 |