مؤتمر
The Problems of Measuring the Electrical Conductivity and the Implementation of Its Measurement Methods of High-alloyed Semiconductors
| العنوان: | The Problems of Measuring the Electrical Conductivity and the Implementation of Its Measurement Methods of High-alloyed Semiconductors |
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| المؤلفون: | Shtern, Maxim, Karavaev, Ivan, Rogachev, Maxim, Mustafoev, Bekhzod |
| المصدر: | 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) Russian Young Researchers in Electrical and Electronic Engineering (EIConRus), 2020 IEEE Conference of. :2187-2192 Jan, 2020 |
| Relation: | 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781728157603 9781728157610 |
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| تدمد: | 23766565 |
| DOI: | 10.1109/EIConRus49466.2020.9039415 |