مؤتمر
The Problems of Measuring the Electrical Conductivity and the Implementation of Its Measurement Methods of High-alloyed Semiconductors
العنوان: | The Problems of Measuring the Electrical Conductivity and the Implementation of Its Measurement Methods of High-alloyed Semiconductors |
---|---|
المؤلفون: | Shtern, Maxim, Karavaev, Ivan, Rogachev, Maxim, Mustafoev, Bekhzod |
المصدر: | 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) Russian Young Researchers in Electrical and Electronic Engineering (EIConRus), 2020 IEEE Conference of. :2187-2192 Jan, 2020 |
Relation: | 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781728157603 9781728157610 |
---|---|
تدمد: | 23766565 |
DOI: | 10.1109/EIConRus49466.2020.9039415 |