Wafer level lead free solder bumping process and characterization

التفاصيل البيبلوغرافية
العنوان: Wafer level lead free solder bumping process and characterization
المؤلفون: Viswanadam, G., Leow Khim Han
المصدر: International Symposium on Electronic Materials and Packaging (EMAP2000) (Cat. No.00EX458) Electronic materials and packaging Electronic Materials and Packaging, 2000. (EMAP 2000). International Symposium on. :7-11 2000
Relation: International Symposium on Electronic Materials and Packaging (EMAP2000)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780366549
9780780366541
DOI:10.1109/EMAP.2000.904127