التفاصيل البيبلوغرافية
| العنوان: |
Lowering the Dark Count Rate of SPAD Implemented in CMOS FDSOI Technology |
| المؤلفون: |
de Albuquerque, T. Chaves, Issartel, D., Clerc, R., Pittet, P., Cellier, R., Calmon, F. |
| المصدر: |
2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2019 Joint International EUROSOI Workshop and International Conference on. :1-4 Apr, 2019 |
| Relation: |
2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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