دورية أكاديمية
Conductive Filament Localization Within Crossbar Resistive Memories by Scanning Joule Expansion Microscopy
| العنوان: | Conductive Filament Localization Within Crossbar Resistive Memories by Scanning Joule Expansion Microscopy |
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| المؤلفون: | Puyoo, E., Albertini, D. |
| المصدر: | IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 41(6):848-851 Jun, 2020 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 07413106 15580563 |
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| DOI: | 10.1109/LED.2020.2986543 |