Improvement of Si/SiO/sub 2/ mask etching selectivity in the new D-RIE process

التفاصيل البيبلوغرافية
العنوان: Improvement of Si/SiO/sub 2/ mask etching selectivity in the new D-RIE process
المؤلفون: Ohara, J., Kano, K., Takeuchi, Y., Otsuka, Y.
المصدر: Technical Digest. MEMS 2001. 14th IEEE International Conference on Micro Electro Mechanical Systems (Cat. No.01CH37090) Micro electro mechanical systems Micro Electro Mechanical Systems, 2001. MEMS 2001. The 14th IEEE International Conference on. :76-79 2001
Relation: Technical Digest MEMS 2001 14th IEEE International Conference on Micro Electro Mechanical Systems
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780359984
9780780359987
تدمد:10846999
DOI:10.1109/MEMSYS.2001.906482