مؤتمر
Reliability Evaluation of Compressed Deep Learning Models
| العنوان: | Reliability Evaluation of Compressed Deep Learning Models |
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| المؤلفون: | Goldstein, B.F., Srinivasan, S., Das, D., Banerjee, K., Santiago, L., Ferreira, V.C., Nery, A.S., Kundu, S., Franca, F.M.G. |
| المصدر: | 2020 IEEE 11th Latin American Symposium on Circuits & Systems (LASCAS) Circuits & Systems (LASCAS), 2020 IEEE 11th Latin American Symposium on. :1-5 Feb, 2020 |
| Relation: | 2020 IEEE 11th Latin American Symposium on Circuits & Systems (LASCAS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781728134277 9781728134260 |
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| تدمد: | 24734667 |
| DOI: | 10.1109/LASCAS45839.2020.9069026 |