مؤتمر
Research on particle size identification method of residue in sealed electronic devices
| العنوان: | Research on particle size identification method of residue in sealed electronic devices |
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| المؤلفون: | Kun, Chu, Yan, Lv, Yu, Gong, Guorong, Song, Zhichao, Ren, Cunfu, He |
| المصدر: | 2019 14th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) Electronic Measurement & Instruments (ICEMI), 2019 14th IEEE International Conference on. :917-922 Nov, 2019 |
| Relation: | 2019 14th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9781728105086 9781728105109 |
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| DOI: | 10.1109/ICEMI46757.2019.9101579 |