التفاصيل البيبلوغرافية
| العنوان: |
Area-Efficient and Bias-Flexible Inline Monitoring Structure for Fast Characterization of RTN and Transistor Local Mismatch in Advanced Technologies |
| المؤلفون: |
Jayakumar, A., Chan, N., Pirro, L., Zimmerhackl, O., Otto, M., Kleissner, T., Hoentschel, J. |
| المصدر: |
2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2020 IEEE 33rd International Conference on. :1-5 May, 2020 |
| Relation: |
2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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