دورية أكاديمية
Oxide Edge Trap Density Extraction in Silicon Nanowire MOSFET From Tunnel Current Noise Measurement in Gated Diode Like Arrangement
| العنوان: | Oxide Edge Trap Density Extraction in Silicon Nanowire MOSFET From Tunnel Current Noise Measurement in Gated Diode Like Arrangement |
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| المؤلفون: | Kumar Sharma, D., Datta, A. |
| المصدر: | IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 20(3):512-516 Sep, 2020 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 15304388 15582574 |
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| DOI: | 10.1109/TDMR.2020.3000356 |