Developing aged SPICE model for hot carrier reliability simulation

التفاصيل البيبلوغرافية
العنوان: Developing aged SPICE model for hot carrier reliability simulation
المؤلفون: Qiuyi Ye, Terletzki, H., Tonti, W.
المصدر: 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) Integrated reliability workshop Integrated Reliability Workshop Final Report, 2000 IEEE International. :153-154 2000
Relation: 2000 IEEE International Integrated Reliability Workshop Final Report
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780363922
9780780363922
DOI:10.1109/IRWS.2000.911926