التفاصيل البيبلوغرافية
العنوان: |
Reliability Characteristics of a High Density Metal- Insulator-Metal Capacitor on Intel’s 10+ Process |
المؤلفون: |
Lin, C.-Y., Avci, U. E., Blount, M. A., Grover, R., Hicks, J., Kasim, R., Kundu, A., Pelto, C. M., Ryder, C., Schmitz, A., Sethi, K., Seghete, D., Towner, D. J., Welsh, A. J., Weber, J., Auth, C. |
المصدر: |
2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-4 Apr, 2020 |
Relation: |
2020 IEEE International Reliability Physics Symposium (IRPS) |
قاعدة البيانات: |
IEEE Xplore Digital Library |