التفاصيل البيبلوغرافية
| العنوان: |
Reliability Characteristics of a High Density Metal- Insulator-Metal Capacitor on Intel’s 10+ Process |
| المؤلفون: |
Lin, C.-Y., Avci, U. E., Blount, M. A., Grover, R., Hicks, J., Kasim, R., Kundu, A., Pelto, C. M., Ryder, C., Schmitz, A., Sethi, K., Seghete, D., Towner, D. J., Welsh, A. J., Weber, J., Auth, C. |
| المصدر: |
2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-4 Apr, 2020 |
| Relation: |
2020 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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