مؤتمر
Comprehensive Quality and Reliability Management for Automotive Product
| العنوان: | Comprehensive Quality and Reliability Management for Automotive Product |
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| المؤلفون: | Hsieh, M. H., Chiang, W.S., Chen, Harry, Lin, M. Z., Lin, M. J. |
| المصدر: | 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-5 Apr, 2020 |
| Relation: | 2020 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781728131993 |
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| تدمد: | 19381891 |
| DOI: | 10.1109/IRPS45951.2020.9128795 |