التفاصيل البيبلوغرافية
| العنوان: |
Origins and Signatures of Tail Bit Failures in Ultrathin MgO Based STT-MRAM |
| المؤلفون: |
Lim, J. H., Raghavan, N., Kwon, J. H., Lee, T. Y., Chao, R., Chung, N. L., Yamane, K., Thiyagarajah, N., Naik, V. B., Pey, K. L. |
| المصدر: |
2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-5 Apr, 2020 |
| Relation: |
2020 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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