مؤتمر
Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit Model
| العنوان: | Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit Model |
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| المؤلفون: | Chen, Ching-Yuan, Cheng, Ching-Hong, Huang, Jiun-Lang, Chakrabarty, Krishnendu |
| المصدر: | 2020 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2020 IEEE. :1-6 May, 2020 |
| Relation: | 2020 IEEE European Test Symposium (ETS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781728143125 9781728143118 |
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| تدمد: | 15581780 |
| DOI: | 10.1109/ETS48528.2020.9131591 |