مؤتمر
Automatic Industry PCB Board DIP Process Defect Detection with Deep Ensemble Method
| العنوان: | Automatic Industry PCB Board DIP Process Defect Detection with Deep Ensemble Method |
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| المؤلفون: | Li, Yu-Ting, Kuo, Paul, Guo, Jiun-In |
| المصدر: | 2020 IEEE 29th International Symposium on Industrial Electronics (ISIE) Industrial Electronics (ISIE), 2020 IEEE 29th International Symposium on. :453-459 Jun, 2020 |
| Relation: | 2020 IEEE 29th International Symposium on Industrial Electronics (ISIE) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781728156354 9781728156347 |
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| تدمد: | 21635145 |
| DOI: | 10.1109/ISIE45063.2020.9152533 |