A reliable copper-free wafer level hybrid bonding technology for high-performance medical imaging sensors

التفاصيل البيبلوغرافية
العنوان: A reliable copper-free wafer level hybrid bonding technology for high-performance medical imaging sensors
المؤلفون: Jouve, A., Lagoutte, E., Crochemore, R., Mauguen, G., Flahaut, T., Dubarry, C., Balan, V., Fournel, F., Bourjot, E., Servant, F., Scannell, M., Rohracher, K., Bodner, T., Faes, A., Hofrichter, J.
المصدر: 2020 IEEE 70th Electronic Components and Technology Conference (ECTC) Electronic Components and Technology Conference (ECTC), 2020 IEEE 70th. :201-209 Jun, 2020
Relation: 2020 IEEE 70th Electronic Components and Technology Conference (ECTC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781728161808
تدمد:23775726
DOI:10.1109/ECTC32862.2020.00044