التفاصيل البيبلوغرافية
| العنوان: |
Characterizing Microwave Connectors over Temperatures Using Thermal-stable Standards |
| المؤلفون: |
Gao, Si-Ping, Cherukhin, Iurii |
| المصدر: |
2020 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) Advanced Materials and Processes for RF and THz Applications (IMWS-AMP), 2020 IEEE MTT-S International Microwave Workshop Series on. :1-3 Jul, 2020 |
| Relation: |
2020 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
