دورية أكاديمية
Performance and Low-Frequency Noise of 22-nm FDSOI Down to 4.2 K for Cryogenic Applications
| العنوان: | Performance and Low-Frequency Noise of 22-nm FDSOI Down to 4.2 K for Cryogenic Applications |
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| المؤلفون: | Cardoso Paz, B., Casse, M., Theodorou, C., Ghibaudo, G., Kammler, T., Pirro, L., Vinet, M., de Franceschi, S., Meunier, T., Gaillard, F. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(11):4563-4567 Nov, 2020 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2020.3021999 |