Interfacial Reaction and Failure Mechanism of SAC/Co-P Solder Joint under Rapid Thermal Fatigue

التفاصيل البيبلوغرافية
العنوان: Interfacial Reaction and Failure Mechanism of SAC/Co-P Solder Joint under Rapid Thermal Fatigue
المؤلفون: Yang, Donghua, Zhai, Xiang, Zhang, Chunhong, Gan, Guisheng, Ran, Teng, Du, Fei, Fan, Tao
المصدر: 2020 21st International Conference on Electronic Packaging Technology (ICEPT) Electronic Packaging Technology (ICEPT), 2020 21st International Conference on. :1-4 Aug, 2020
Relation: 2020 21st International Conference on Electronic Packaging Technology (ICEPT)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781728168265
DOI:10.1109/ICEPT50128.2020.9202692