دورية أكاديمية
Time and Area Optimized Testing of Automotive ICs
| العنوان: | Time and Area Optimized Testing of Automotive ICs |
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| المؤلفون: | Mukherjee, N., Tille, D., Sapati, M., Liu, Y., Mayer, J., Milewski, S., Moghaddam, E., Rajski, J., Solecki, J., Tyszer, J. |
| المصدر: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 29(1):76-88 Jan, 2021 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 10638210 15579999 |
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| DOI: | 10.1109/TVLSI.2020.3025138 |