دورية أكاديمية
Impact of Process Variability on Write Error Rate and Read Disturbance in STT-MRAM Devices
| العنوان: | Impact of Process Variability on Write Error Rate and Read Disturbance in STT-MRAM Devices |
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| المؤلفون: | Song, J., Dixit, H., Behin-Aein, B., Kim, C.H., Taylor, W. |
| المصدر: | IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 56(12):1-11 Dec, 2020 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189464 19410069 |
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| DOI: | 10.1109/TMAG.2020.3028045 |