دورية أكاديمية
Reliability of Logic-in-Memory Circuits in Resistive Memory Arrays
| العنوان: | Reliability of Logic-in-Memory Circuits in Resistive Memory Arrays |
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| المؤلفون: | Zanotti, T., Zambelli, C., Puglisi, F.M., Milo, V., Perez, E., Mahadevaiah, M.K., Ossorio, O.G., Wenger, C., Pavan, P., Olivo, P., Ielmini, D. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(11):4611-4615 Nov, 2020 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2020.3025271 |