التفاصيل البيبلوغرافية
| العنوان: |
Research on the sampling reliability of process layer device in smart substation |
| المؤلفون: |
Yan, Zhihui, Lv, Lijuan, Wu, Shuanghui, Su, Yaxin, Wang, Zhenyu, Zhang, Zhen |
| المصدر: |
2019 IEEE 8th International Conference on Advanced Power System Automation and Protection (APAP) Advanced Power System Automation and Protection (APAP), 2019 IEEE 8th International Conference on. :248-252 Oct, 2019 |
| Relation: |
2019 IEEE 8th International Conference on Advanced Power System Automation and Protection (APAP) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
