مؤتمر
Test Methodology for Defect-based Bridge Faults
| العنوان: | Test Methodology for Defect-based Bridge Faults |
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| المؤلفون: | Hu, Yu-Pang, Chang, Shuo-Wen, Wu, Kai-Chiang, Wang, Chi Chun, Huang, Fu-Sheng, Tang, Yi-Lun, Chen, Yung-Chen, Chen, Ming-Chien, Chao, Mango C.-T. |
| المصدر: | 2020 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2020 IEEE International. :106-111 Sep, 2020 |
| Relation: | 2020 IEEE International Test Conference in Asia (ITC-Asia) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9781728189444 |
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| DOI: | 10.1109/ITC-Asia51099.2020.00030 |