Data retention failure in NOR flash memory cells

التفاصيل البيبلوغرافية
العنوان: Data retention failure in NOR flash memory cells
المؤلفون: Lee, W.H., Dong-Kyu Lee, Young-Min Park, Keon-Soo Kim, Kun-Ok Ahn, Kang-Deog Suh
المصدر: 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) Reliability physics symposium Reliability Physics Symposium, 2001. Proceedings. 39th Annual. 2001 IEEE International. :57-60 2001
Relation: 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780365879
9780780365872
DOI:10.1109/RELPHY.2001.922882