مؤتمر
Data retention failure in NOR flash memory cells
العنوان: | Data retention failure in NOR flash memory cells |
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المؤلفون: | Lee, W.H., Dong-Kyu Lee, Young-Min Park, Keon-Soo Kim, Kun-Ok Ahn, Kang-Deog Suh |
المصدر: | 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) Reliability physics symposium Reliability Physics Symposium, 2001. Proceedings. 39th Annual. 2001 IEEE International. :57-60 2001 |
Relation: | 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780365879 9780780365872 |
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DOI: | 10.1109/RELPHY.2001.922882 |