مؤتمر
Accelerated stressing and degradation mechanisms for Si-based photo-emitters
| العنوان: | Accelerated stressing and degradation mechanisms for Si-based photo-emitters |
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| المؤلفون: | Chatterjee, A., Verma, A., Bhuva, B., Jansen, E.D., Wei Chiang Lin |
| المصدر: | 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) Reliability physics symposium Reliability Physics Symposium, 2001. Proceedings. 39th Annual. 2001 IEEE International. :200-205 2001 |
| Relation: | 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780365879 9780780365872 |
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| DOI: | 10.1109/RELPHY.2001.922902 |