مؤتمر
Tools for the characterization of bipolar CML testability
| العنوان: | Tools for the characterization of bipolar CML testability |
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| المؤلفون: | Monte, G., Antaki, B., Patenaude, S., Savaria, Y., Thibeault, C., Trouborst, P. |
| المصدر: | Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 VLSI test symposium VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001. :388-395 2001 |
| Relation: | Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0769511228 9780769511221 |
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| DOI: | 10.1109/VTS.2001.923467 |